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CHRocodile 2 IT TW

CHRocodile 2 IT HTW

CHRocodile 2 IT HTW

The CHRocodile 2 IT HTW optical sensor works with infrared light and has been specially optimized for the non-contact measurement of the thickness of thin wafers. Further fields of application include the thickness measurement of visually opaque and transparent plastic films. The interferometric measuring technique allows high-resolution and robust measurement from one side. The extraordinarily high dynamic response and the outstanding signal-to-noise ratio of the CHRocodile sensors ensure the best measuring results.

  • thin wafer
  • transparent and opaque plastic films
  • measurements from one side
  • inline and offline
  • high lateral resolution
  • simple to integrate
  • wide measuring distance tolerance range
  • measurements/seconds: 4000
  • interferometric measuring range: 4 µm - 200 µm
  • resolution: 3 x 10-6 x upper measuring range limit
  • repeatability: 10-4 x upper measuring range limit
  • synchronization with external devices: trigger input, synchronization output, 5 encoder inputs
  • Interface: Ethernet, RS-422, 2 x analog out (± 10V), LVDT
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