Doped wafers and multi-layer structures. Up to 70.000 measurements/second. Interferometric measuring range 15 µm - 7500 µm

Wafers and multi-layer structures. Also for rough wafers (RW). Up to 70.000 measurements/second. Interferometric measuring range 38 µm - 8200 µm, respectively 44 µm - 6400 µm (RW)

Wafers and multi-layer structures. Up to 70,000 measurements/second. Interferometric measuring range    29 µm - 3200 µm

Thin wafers and multi-layer structures. Up to 4.000 measurements/second. Interferometric measuring range 4 µm - 300 µm

The optical sensor CHRocodile 2 K has been optimized for the non-contact measurement of plastic products. Interferometric measuring range: 15 µm - 1500 µm, Resolution:  6.6 x 10 ^-6 x upper measuring range limit.